This is the README of the XOP extension "prow"

Definitions:
============

"XOP" : A multiplatform graphical user interface  for synchrotron 
        radiation spectral, optics and data analysis calculations. 
	For more info, see:
        http://www.esrf.fr/computing/expg/subgroups/theory/idl/xop/xop.html

"XOP extension" is a software package which is not part of the XOP 
                installation, but it can be installed optionally and run 
                under the XOP interface.


PROW:
=====
A DATA INTEGRATION PROGRAM BASED ON PROFILE FITTING FOR THE EVALUATION OF 
WEAK AND/OR OVERLAPPED 2-DIMENSIONAL MACROMOLECULAR DIFFRACTION PATTERNS.

by  Bourgeois*#, D.,  Nurizzo@, D., Kahn$, R., & Cambillau@, C.
  
  * : ESRF, France ; # : LCCP, IBS, Grenoble, France. ;
  $ : LCCP, IBS, Grenoble, France. ; @ :AFMB, CNRS, Marseille, France.
  email : bourgeoi@esrf.fr

We have developed a new technique for the integration of weak and/or
spatially overlapped two dimensional diffraction patterns. The program,
named PROW (PRofile fitting for Overlapped and Weak data) can be used for
the evaluation of either Laue or monochromatic data. It is compatible with
the Daresbury Laue software suite [1] and with the DENZO package [2]. It
uses box integration with optimized summation area for strong, non overlapped
spots, and profile fitting with optimized profile fitting area for weak and/or
overlapped spots. Sizes of the integration areas are dynamically adjusted to
find the best compromise between minimal bias resulting from statistical
fluctuations of the X-ray background, and maximal use of the information
content in each diffraction spot. Deconvolution of spatially overlapped spots,
a frequent problem in Laue diffraction, and not so rare in the case of
monochromatic data collection, is performed by a standard least-square
procedure. Fourier interpolation of reference profiles is used to overcome
effects of discrete data sampling. The program has been tested on several
data sets recorded on image plate and CCD detectors. Observed improvement in
statistical factors (Rmerge, redundancy, completeness) resulted in several
cases in concomitant improvement in atomic model refinement.
 
 [1] Campbell, J.W. (1993). Laue Software Suite, CCLRC Daresbury Laboratory,
 Warrington, England.
 [2] Otwinowsky, Z. (1993). in Proceedings of the CCP4 Study Weekend,
 Daresbury Laboratory, Warrington, England, 56-62.



Requirements:
=============
  1) A Unix Machine (HP, Solaris, Silicon Graphics or Linux)
  2) XOP installed on it.
  2) installing PROW for XOP-EMBEDDED (see next).

installing PROW for XOP-EMBEDDED
================================
  1) Download file:
       ftp://ftp.esrf.fr/expg/idl/xop/extensions/prow.tar.Z
  2) Copy (or move) prow.tar.Z to your .../xop/extensions directory, and 
       change directory to it.
  3) Unpack prow.tar.Z with the unix command:
       cat prow.tar.Z | tar xvf -
     As a result you should get two files and one directory
       prow.sav (file)
       batch_prow.sav (file)
       PROW (directory)
  4) Start prow by either:
     i) At the  Unix prompt, type:
       xop prow
     ii) From the main XOP window:
         a) Select Tools -> IDL Macro
	 b) Clear the window and type prow
	 c) Select File -> Quit and accept changes

  5) Problems, bug reports, suggestions etc should be addressed to: 
     bourgeoi@esrf.fr and srio@esrf.fr